Effect of Annealing Temperature on The Refrective Index and Dielectric Properties of TiO2/MnO2 CORE/SHELL Thin Films

Authors

  • Peter Ekuma Agbo Division of MaterialScience and Renewable Energy. Department of Industrial Physics Ebonyi State University Abakaliki, Nigeria

DOI:

https://doi.org/10.24297/jap.v6i3.1756

Keywords:

Core/shell, Chemical bath, annealing, temperature, refractive index, dielectric, XRD

Abstract

Thin film of the form TiO2/MnO2 was deposited using the chemical bath method. The deposited thin films were annealed at temperatures of in order to investigate the effect of annealing temperature on the refractive index and dielectric property. To do this the films were characterized using UV-Spectrophotometer and XRD analysis was also carriedout to study the structural nature of the deposited film. Our results reaveled that annealing has profound effect on theindex of refraction and the dielectric properties. 

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Published

2014-12-05

How to Cite

Agbo, P. E. (2014). Effect of Annealing Temperature on The Refrective Index and Dielectric Properties of TiO2/MnO2 CORE/SHELL Thin Films. JOURNAL OF ADVANCES IN PHYSICS, 6(3), 1227–1232. https://doi.org/10.24297/jap.v6i3.1756

Issue

Vol. 6 No. 3

Section

Articles

License

Creative Commons License All articles published in Journal of Advances in Linguistics are licensed under a Creative Commons Attribution 4.0 International License.