An Elemental Analysis of Different CD-R discs

Authors

  • Amir Pishkoo Nuclear Science and Technology Research Institute(NSTRI) P.O. Box 14395-836, Tehran.

DOI:

https://doi.org/10.24297/jap.v5i1.1976

Keywords:

RBS technique, PIXE technique, CD-R disk, Label side (up), Record side (down)

Abstract

In this study Proton Induced X-ray Emission (PIXE) and Rutherford Backscattering Spectrometry (RBS) as reliable and non-destructive techniques has been applied to compare thickness, major and trace elements of different brands of CD-R discs. Three elements, namely Ag, Ba, and Ti were found to be the major elements.

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Author Biography

Amir Pishkoo, Nuclear Science and Technology Research Institute(NSTRI) P.O. Box 14395-836, Tehran.

Physics and Accelerators Research School

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Published

2014-08-02

How to Cite

Pishkoo, A. (2014). An Elemental Analysis of Different CD-R discs. JOURNAL OF ADVANCES IN PHYSICS, 5(1), 752–756. https://doi.org/10.24297/jap.v5i1.1976

Issue

Vol. 5 No. 1

Section

Articles

License

Creative Commons License All articles published in Journal of Advances in Linguistics are licensed under a Creative Commons Attribution 4.0 International License.