Structural and optical properties of Tin Oxide and Indium doped SnO2 thin films deposited by thermal evaporation technique

Authors

  • Sura Ali Noaman University of Al-Kufa College of Education
  • Rashid Owaid Kadhim University of Al-Kufa College of Education
  • Saleem Azara Hussain University of Al-Qadisiyah College of Education

DOI:

https://doi.org/10.24297/jap.v12i3.45

Keywords:

Tin Oxide, Indium doped Tin Oxide, Silicon substrate, Structural Properties, Optical properties

Abstract

Tin Oxide and Indium doped Tin Oxide (SnO2:In) thin films were deposited on glass and Silicon substrates by  thermal evaporation technique. X-ray diffraction pattern of  pure SnO2 and SnO2:In thin films annealed at 650oC and the results showed that the structure have tetragonal phase with preferred orientation in (110) plane. AFM studies showed an inhibition of grain growth with increase in indium concentration. SEM studies of pureSnO2 and  Indium doped tin oxide (SnO2:In) ) thin films showed that the films with regular distribution of particles and they have spherical shape. Optical properties such as Transmission , optical band-gap have been measured and calculated.

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Author Biography

Sura Ali Noaman, University of Al-Kufa College of Education

Master of physics


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Published

2016-10-30

How to Cite

Noaman, S. A., Kadhim, R. O., & Hussain, S. A. (2016). Structural and optical properties of Tin Oxide and Indium doped SnO2 thin films deposited by thermal evaporation technique. JOURNAL OF ADVANCES IN PHYSICS, 12(3), 4394–4399. https://doi.org/10.24297/jap.v12i3.45

Issue

Vol. 12 No. 3

Section

Articles

License

Creative Commons License All articles published in Journal of Advances in Linguistics are licensed under a Creative Commons Attribution 4.0 International License.