AN EFFICIENT ERROR DETECTION AND CORRECTION METHOD FOR TIMING ERRORS
DOI:
https://doi.org/10.24297/jac.v12i21.67Keywords:
Timing errors, Error detection, Error correction, Bit flipping flip flop.Abstract
Timing errors are an important concern in nanometer CMOS technologies. A promising way to overcome the timing errors is the development of error detection and correction techniques. A local error detection and correction technique is done in this work. It is based on a new bit flipping flip flop. Whenever a timing error is detected, it is corrected by complementing the output of the corresponding flip flop. No extra circuitry is inserted in the design. Timing errors are identified and corrected within a single cycle and hence design complexity is reduced which results in reduced power consumption and low silicon area when compared to the earlier designs.
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14. M. Agarwal, V. Balakrishnan, A. Bhuyan, K. Kim, B. C. Paul, W.Wang, B. Yang, Y. Cao, and S. Mitra, “Optimized
circuit failure prediction for aging: Practicality and promise,†in Proc. IEEE Int.Test Conf., 2008, pp. 1–10.
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Des.TestComput.,vol.23,no.6,pp.8–17,Nov.2009.
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invariant-based concurrent test,†IEEE Trans. Rel., vol. 53, no. 2, pp. 269–278, Jun. 2004.
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Theory Appl., vol. 12, no. 1/2, pp. 7–20, 1998.
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Test Symp.,1999,pp.86–94.
20. H. Yu, M. Nicolaidis, L. Anghel, and N-E. Zergainoh, “Efï¬cient fault detection architecture design of latch-based low
power DSP/MCU processor,†in Proc. IEEE Eur. Test Symp., 2011,pp. 177–183.
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Published
2016-12-14
How to Cite
Revathy, M., & Santhia, T. (2016). AN EFFICIENT ERROR DETECTION AND CORRECTION METHOD FOR TIMING ERRORS. JOURNAL OF ADVANCES IN CHEMISTRY, 12(21), 5285–5291. https://doi.org/10.24297/jac.v12i21.67
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