Structural and optical properties Investigation of ZnxCd1-xS thin films

Abstract

CdZn_XS_1-X thin films with different composition have been deposited on glass substrate by by the spray pyrolysis method at RT using CdCl₂ (0.1M),ZnCl₂(0.1M)and H₂NCSNH₂(0.1M)solution and a substrate temperature of ( 400±20^°C). X-ray diffraction studies reveal that the films are polycrystalline in nature with hexagonal structure and preferential orientation along (002) . The grain size of the films is found to increase form  (37.397 to 46.902) nm with increasing Zinc concentration while the strain and the dislocation density of the films are found to decrease from (7.15 to 4.54) 10 ⁴ rad and from (3.82 to 1.93) 10 ¹⁴ lines.m^-2 respectively . The  transmittance  spectrums  of  CdZn_xS_1-x  thin  films  reveal very pronounced interference effects for photon energies below the fundamental absorption edge by exhibiting interference pattern . The optical energy gap for CdZn_xS_1-x thin films increases and shifts towards the UV region  as the  Zn concentration in the films increased .