Exponential two step approach for Time Domain based Software Process Control

Authors

  • Dr. R.Satya Prasad Acharya Nagrjuna University Nagarjuna Nagar
  • S. Murali Mohan Vikrama Simhapuri University, Nellore
  • G.Krishna Mohan P.B.Siddhartha college, Vijayawada

DOI:

https://doi.org/10.24297/ijct.v8i2.3385

Keywords:

Statistical Process Control, Software reliability, G-O Model, Mean Value function, two step approach, Probability limits, Control Charts, Software Engineering, Statistical Reliability

Abstract

Software Reliability Growth Model is a mathematical model of how the software reliability improves as faults are detected and repaired. In this paper we propose a control mechanism based on the cumulative quantity between observations of time domain failure data using mean value function of Goel-Okumoto model, which is based on Non Homogenous Poisson Process. The model parameters are estimated by a two step approach. Software reliability process can be monitored efficiently by using Statistical Process Control. Control charts are widely used for process monitoring. It assists the software development team to identify failures and actions to be taken during software failure process and hence, assures better software reliability. 

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Author Biographies

Dr. R.Satya Prasad, Acharya Nagrjuna University Nagarjuna Nagar

Associate Professor, Dept. of CS & Engg.

S. Murali Mohan, Vikrama Simhapuri University, Nellore

Controller of Examinations

G.Krishna Mohan, P.B.Siddhartha college, Vijayawada

Reader Dept. of Computer Science

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Published

2013-06-20

How to Cite

Prasad, D. R., Mohan, S. M., & Mohan, G. (2013). Exponential two step approach for Time Domain based Software Process Control. INTERNATIONAL JOURNAL OF COMPUTERS &Amp; TECHNOLOGY, 8(2), 777–786. https://doi.org/10.24297/ijct.v8i2.3385

Issue

Vol. 8 No. 2 (2013)

Section

Research Articles
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