AGBO, P. E. Effect of Annealing Temperature on The Refrective Index and Dielectric Properties of TiO2/MnO2 CORE/SHELL Thin Films. JOURNAL OF ADVANCES IN PHYSICS, [S. l.], v. 6, n. 3, p. 1227–1232, 2014. DOI: 10.24297/jap.v6i3.1756. Disponível em: https://rajpub.com/index.php/jap/article/view/2049. Acesso em: 22 dec. 2024.