FUJIKAWA, M. Study of Vulnerability Diagnosis and Sustaining Integrity of the Embedded Devices. INTERNATIONAL JOURNAL OF COMPUTERS & TECHNOLOGY, [S. l.], v. 11, n. 2, p. 2231–2240, 2013. DOI: 10.24297/ijct.v11i2.1180. Disponível em: https://rajpub.com/index.php/ijct/article/view/1180. Acesso em: 6 jul. 2024.